Non-contact surface quality inspections with high accuracy can be achieved by fringe projection and confocal inspection methods enabled through the use of our microdisplay systems.

The availability of a third dimension of measurement enables both surface roughness and depth measurements for quality control of critical components in the electronic, optical and semiconductor manufacturing industries. Our microdisplay offers a further advantage of high speed which allows faster 3D measurements without loss of precision.

ForthDD's SXGA-3DM microdisplay solution is specifically designed to meet the demands of optical metrology system builders. For more information on the SXGA-3DM development kit, please click here.



ForthDD at the heart of Sensofar's innovative imaging profiler

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The Use of LCoS Microdisplays in 3D Optical Surface Metrology Systems

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3D Metrology Presentation at SID ME Spring Meeting in Jena (March 2008)

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