Hall B2, Booth 159, 22- 25 June 2015
Learn about our next generation 3.1 MPixel SLM optimised for use in 3D Metrology and Super Resolution Microscopy.
Experience our QXGA (2048 x 1536) Microdisplay in a Near-To-Eye reference design suitable for application as Electronic View Finder (EVF), Head Mounted Display (VR & AR).
Immerse yourself in the 3D world using our high resolution stereoscopic viewer.
Henning Molsen, Director of Sales, will present the new QXGA-3DM at the co-located SPIE Conference on “Optical Metrology” (ICM, Room 14C) on Monday at 12:40.